Description: Metrology software for the semiconductor industry. Download the evaluation copy of WAFERMAP or PANELMAP. Read, analyze and visualize data files from semiconductor metrology equipment.

Keywords: wafermap, panelmap, semiconductor, software, metrology, equipment, IC, LCD, TFT, solar, panel, wafer, wafermap-view.ocx, waferview.ocx, 1D Plot, line scan, 2D Contour Plot, 2D Color Plot, value plot, 3D Color Plot, 3D bar chart, sigma range plot, statistical analysis, histogram, standard deviation, Import data from metrology tools, F4 Dimensions, AMS SRD/MRD, CDE ResMap, FILMetrics, KLA Tencor RS 100, KLA Tencor F5 Ellipsometer, NanoPhotonics, Napson WS300, Nicolet, Plasmos, Prometrix Rs, Prometrix UV-1250, QC Solutions, Rigaku, Rudolph, Rudolph Metapulse, SOPRA SE, Semitek, Thermawave Optiprobe and Thermaprobe, TWIN, E & H, Foothill, Jenoptik, ISIS optronics, Sigmatech, Tepla, OPUS, circular, Cartesian, test diameter, SPC, Trend charts, All points, all wafers, Stacked Maps, Sigma Sorting Filter, Interpolation, DCOM (ActiveX server), DDE linking

Tags: boin, gmbh, idx, nach, write, schriftst==, lhg, metrology, semiconductor, gif, schriftst>=, text, vza, omo, maleverz, jsp, klappauf, klappzu, wafermap, plot, data, panelmap, software, equipment, vzzu, oicon, function, vstat, window, vzz, laenge, vstat==, idx==nach, vzauf, llesaufzu, zweig, zicon, industry, analyze, visualize,

Boin-gmbh.com

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