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Home - Materials Characterization Services
Description: Materials Characterization Services is an analytical service broker, providing scientists and engineers with the exact analysis they need to solve their materials problem.
Keywords: Materials Analysis, Materials Characterization, Laboratory, MAT-CS, SIMS, Auger, AES, RBS, NMR, XPS, ESCA, XRF, XRD, XRR, GCMS, GC/MS, AA, LECO, DSC, CMA, EPR, EPMA, ESR, FTIR, GDMS, ICP-OES, ICPM, IGA, IC, LA-ICPMS, NAA, NMR, OES, PIXE, CD-OES, RIMS, TIMS, TMA, TGA, WDS, WDX, XRD, XRF, EELS, EDS, EDX, FIB, LA-ICPMS, MFM, SEM, STEM, TEM, XRT, AFM, AES, EBSD, ESCA, EXAFS, HFS, ISS, LA-ICPMS, LEXES, NRA, RBS, SPM, TOF-SIMS, TXRF, VPD-ICPMS, XPS, XRR, EPR, ESR, FTIR, GC, GCMS, GPC, HPLC, IC, LC, MS, MALDI, NMR, UV-VIS, GCMS, GPC, HPLC, ICP-MS, ICP-OES, IC, LC, MS, RGA, TOC, ATE, C-V, DLTS, ECV, ESD, EMMI, FIB, HAST, µPCD, SIRM, SRP, SPV, FA, ROHS, WEEE, Failure Analysis, Assay, Porosimetry, Surface Area, Raman, Residual Stress, density, gravimetry, x-ray imaging, electron microscopy, optical microscopy, light microscopy, acoustic microscopy, tribology, microhardness, nanohardness, ellipsometry, wafer bow, dimensional analysis, profilometry, polymer deformulation, outgassing, nanotoxicity, Materials Analysis, Materials Characterization, Laboratory, MAT-CS, SIMS, Auger, AES, RBS, NMR, XPS, ESCA, XRF, XRD, XRR, GCMS, GC/MS, AA, LECO, DSC, CMA, EPR, EPMA, ESR, FTIR, GDMS, ICP-OES, ICPM, IGA, IC, LA-ICPMS, NAA, NMR, OES, PIXE, CD-OES, RIMS, TIMS, TMA, TGA, WDS, WDX, XRD, XRF, EELS, EDS, EDX, FIB, LA-ICPMS, MFM, SEM, STEM, TEM, XRT, AFM, AES, EBSD, ESCA, EXAFS, HFS, ISS, LA-ICPMS, LEXES, NRA, RBS, SPM, TOF-SIMS, TXRF, VPD-ICPMS, XPS, XRR, EPR, ESR, FTIR, GC, GCMS, GPC, HPLC, IC, LC, MS, MALDI, NMR, UV-VIS, GCMS, GPC, HPLC, ICP-MS, ICP-OES, IC, LC, MS, RGA, TOC, ATE, C-V, DLTS, ECV, ESD, EMMI, FIB, HAST, µPCD, SIRM, SRP, SPV, FA, ROHS, WEEE, Failure Analysis, Assay, Porosimetry, Surface Area, Raman, Residual Stress, density, gravimetry, x-ray imaging, electron microscopy, optical microscopy, light microscopy, acoustic microscopy, tribology, microhardness, nanohardness, ellipsometry, wafer bow, dimensional analysis, profilometry, polymer deformulation, outgassing, nanotoxicity
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Materials-characterization-services.com
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MATERIALS-CHARACTERIZATION-SERVICES.COM - Site Location |
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United States |
City/Region/Zip Code |
Wayne, PA, 19087 |
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1&1 Internet |
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1&1 Internet |
MATERIALS-CHARACTERIZATION-SERVICES.COM - Domain Information |
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MATERIALS-CHARACTERIZATION-SERVICES.COM [ Traceroute RBL/DNSBL lookup ] |
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1&1 IONOS SE 1&1 IONOS SE |
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whois.verisign-grs.com |
Created |
29-May-2009 |
Updated |
30-May-2020 |
Expires |
29-May-2021 |
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A.NS36.DE 91.195.240.163 B.NS36.DE 91.195.241.163
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Date |
Wed, 13 Apr 2011 19:29:02 GMT |
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