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materials-characterization-services.com: Home - Materials Characterization Services
Materials Characterization Services is an analytical service broker, providing scientists and engineers with the exact analysis they need to solve their materials problem.  
 
 

Home - Materials Characterization Services

Description: Materials Characterization Services is an analytical service broker, providing scientists and engineers with the exact analysis they need to solve their materials problem.

Keywords: Materials Analysis, Materials Characterization, Laboratory, MAT-CS, SIMS, Auger, AES, RBS, NMR, XPS, ESCA, XRF, XRD, XRR, GCMS, GC/MS, AA, LECO, DSC, CMA, EPR, EPMA, ESR, FTIR, GDMS, ICP-OES, ICPM, IGA, IC, LA-ICPMS, NAA, NMR, OES, PIXE, CD-OES, RIMS, TIMS, TMA, TGA, WDS, WDX, XRD, XRF, EELS, EDS, EDX, FIB, LA-ICPMS, MFM, SEM, STEM, TEM, XRT, AFM, AES, EBSD, ESCA, EXAFS, HFS, ISS, LA-ICPMS, LEXES, NRA, RBS, SPM, TOF-SIMS, TXRF, VPD-ICPMS, XPS, XRR, EPR, ESR, FTIR, GC, GCMS, GPC, HPLC, IC, LC, MS, MALDI, NMR, UV-VIS, GCMS, GPC, HPLC, ICP-MS, ICP-OES, IC, LC, MS, RGA, TOC, ATE, C-V, DLTS, ECV, ESD, EMMI, FIB, HAST, µPCD, SIRM, SRP, SPV, FA, ROHS, WEEE, Failure Analysis, Assay, Porosimetry, Surface Area, Raman, Residual Stress, density, gravimetry, x-ray imaging, electron microscopy, optical microscopy, light microscopy, acoustic microscopy, tribology, microhardness, nanohardness, ellipsometry, wafer bow, dimensional analysis, profilometry, polymer deformulation, outgassing, nanotoxicity, Materials Analysis, Materials Characterization, Laboratory, MAT-CS, SIMS, Auger, AES, RBS, NMR, XPS, ESCA, XRF, XRD, XRR, GCMS, GC/MS, AA, LECO, DSC, CMA, EPR, EPMA, ESR, FTIR, GDMS, ICP-OES, ICPM, IGA, IC, LA-ICPMS, NAA, NMR, OES, PIXE, CD-OES, RIMS, TIMS, TMA, TGA, WDS, WDX, XRD, XRF, EELS, EDS, EDX, FIB, LA-ICPMS, MFM, SEM, STEM, TEM, XRT, AFM, AES, EBSD, ESCA, EXAFS, HFS, ISS, LA-ICPMS, LEXES, NRA, RBS, SPM, TOF-SIMS, TXRF, VPD-ICPMS, XPS, XRR, EPR, ESR, FTIR, GC, GCMS, GPC, HPLC, IC, LC, MS, MALDI, NMR, UV-VIS, GCMS, GPC, HPLC, ICP-MS, ICP-OES, IC, LC, MS, RGA, TOC, ATE, C-V, DLTS, ECV, ESD, EMMI, FIB, HAST, µPCD, SIRM, SRP, SPV, FA, ROHS, WEEE, Failure Analysis, Assay, Porosimetry, Surface Area, Raman, Residual Stress, density, gravimetry, x-ray imaging, electron microscopy, optical microscopy, light microscopy, acoustic microscopy, tribology, microhardness, nanohardness, ellipsometry, wafer bow, dimensional analysis, profilometry, polymer deformulation, outgassing, nanotoxicity

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Materials-characterization-services.com

Content Revalency: Title: 75.00%   Description: 63.64%   Keywords: 3.42%  |  Document size: 6,272 bytes
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MATERIALS-CHARACTERIZATION-SERVICES.COM - Site Location
Country/Flag US United States
City/Region/Zip Code Wayne, PA, 19087
Organization 1&1 Internet
Internet Service Provider 1&1 Internet
 
MATERIALS-CHARACTERIZATION-SERVICES.COM - Domain Information
Domain MATERIALS-CHARACTERIZATION-SERVICES.COM   [ Traceroute  RBL/DNSBL lookup ]
Registrar 1&1 IONOS SE 1&1 IONOS SE
Whois server whois.verisign-grs.com
Created 29-May-2009
Updated 30-May-2020
Expires 29-May-2021
Time Left 0 days 0 hours 0 minutes
Status ok https://icann.org/epp#ok ok https://www.icann.org/epp#ok
DNS servers A.NS36.DE   91.195.240.163
B.NS36.DE   91.195.241.163
 
MATERIALS-CHARACTERIZATION-SERVICES.COM - DNS Information
IP Address 74.208.178.69 ~ Whois - Trace Route - RBL Check
Domain Name Servers ns58.1and1.com   217.160.83.31
ns57.1and1.com   217.160.82.32
Mail Exchange mx01.1and1.com   74.208.5.21
mx00.1and1.com   74.208.5.3
 
Site Response Header
Response HTTP/1.1 302 Found
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Date Wed, 13 Apr 2011 19:29:02 GMT
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