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Scientific Computing International - Raising Thin Film Metrology to a New Level. SCI offers metrology systems for thin-film material characterization, with models that range from table-top systems suitable for R&D to fully automated, standalone production tools, and software products for thin-film analysis and design
Scientific Computing International (SCI) provides high resolution thin film metrology tools and analysis software products to leading companies in the semiconductor, optoelectronics, display, MEMS, data storage, and optical coating industries. SCI also provides software for optical thin film design and material analysis including FilmWizard, an optical thin film design and material analysis program, and FilmEllipse, an analysis and acquisition tool that can be used with any ellipsometer. (Ellipsometer, reflectometer, polarimeter, reflection, transmission, ellipsometry, duv spectroscopic ellipsometer, NIR spectroscopic ellipsometer, spectrophotometer, spectroscopic ellipsometer, film thickness, index of refraction, optical constants, index, thickness, extinction coefficient, birefringence, energy band gap, surface roughness, crystallinity, film properties versus temperature, multilayer thicknesses, integrated metrology modules, semiconductor, III-V compound semiconductor, optoelectronics, optics, photonics, data storage, display, micro electromechanical system (MEMS), nanotechnology, and optical coating industries)
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Our focus is on providing cost-effective soil and groundwater characterization, fate and transport, and remediation services. THWA’s involvement in the development of such cutting edge remedial approaches as natural attenuation and enhanced bioremediation and our risk-based approach to remediation has saved our clients and others well over $1 billon in site characterization and remediation expenses.
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