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CATRAM Solutions
As the complexity of the memory behavior increases
with every new generation, attempts are being
made to come up with a methodical approach that employs
electrical simulation to tackle the memory test problem.
CATRAM provides a framework of algorithms and tools
developed in a collaboration between the Delft University
of Technology and Infineon Technologies to systematically
analyze DRAM faulty behavior using electrical spice simulation.
Catram.com ~
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